Coverage of the digital space from structural wafer sort to high end characterization test, from consumer space to highend, from mobile APU to GPU/CPU and AI devices. 0000168589 00000 n With higher quality signals, the control and performance needed for accurate stimulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. 0000031852 00000 n Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. Older testers having single clock domains and primitive ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. The cards innovative architecture allows simultaneous and fully independent testing on as many as 32 instruments with totally different settings, significantly reducing the cost of test for complex mixed-signal devices. Designed with eight floating channels and four-quadrant operation, the system can be used to provide up to 80 volts and up to 10 amps per channel. A few months experience in testing digital ICs with the V93000 SOC test system; Familiarity with the programming language C++; Familiarity with analog and digital conversion circuits and their characteristics; Outcome: Understand how to make test plan develop test programs for mixed-signal devices You will know the how to: V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. The PowerMUX card offers a "sea of switches" for individual usage in typical power applications. 0000008536 00000 n The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 400 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. 0000349795 00000 n 0000014977 00000 n Advantest. Calibration, test flow, test methods, debbuging tools, and concepts. The V93000 Port Scale RF architecture makes key contributions in several dimensions: WLCSP require test coverage of final test at probe to enable known good die testing. The Advantest bridge beams are specifically designed to match all application areas, featuring cut outs to provide the required instrument space, so that the new front-end modules can access the DUT interface board / probe card. Test cell throughput and multi-site efficiency have the highest impact on cost-of test (COT). Click on more information for further details. TSE: 6857. .4(m $8@ s9QXc&}Zu|'Zr;nJp1p!nOLOp,/WqB=W@0J;fVK8 .}yI#2@p8Y/m68Q{$nFRC Jh).b`WgUGotk7hO o}MT`.2'g(uTC)fnSAQ 0000014447 00000 n New technologies consistently come with new fail mechanisms, such that advanced silicon debug and efficient yield learning during process and device ramp become an integral necessity in the race to market. With it's breakthrough Direct Probe probe card interface technology the V93000 offers 4 times the component space on the probe card with optimal signal integrity to allow known good die testing with higher multisite already at probe. New technologies consistently come with new fail mechanisms, such that advanced silicon debug becomes an integral necessity in the race to market. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. Requires myAdvantest login and corresponding privileges. A graphical test flow editor links device tests into a production-ready test program, where the tests are set up via fill-in-the-blank test functions. The UltraPin1600 implements Teradyne's ground-breaking multicore, hardware-based Protocol Aware capability that allows individual pin groups to be saved to device data rate and timing and eliminates the need for digital patterns for programming standard data busses. 0000011255 00000 n Digital devices (logic and memory) lead the process technology shrink steps in the industry. Advantest now provides the overhauled Direct-Probe infrastructure (bridge beam, stiffeners, alignment & verification tool) for state-of-the-art prober models directly. 0000033307 00000 n TEAM A.T.E. Advantest Corporation 0000252684 00000 n The ongoing semiconductor integration trend leads to complex I/O structures which demand the connection of universal ATE resources featuring analog, mixed signal and digital capabilities on the same instrument channel. The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. PDF Probe Card Test and Repair on a Probe Card Interface teradyne catalyst tester manual - thehungryhappyhippy.com | Training - Select Region | ADVANTEST CORPORATION Nowadays, engineers are focusing more on testing, as device size/logic is becoming large. Highest performance for high-volume manufacturing, multi-site probe test of digital, mixed-signal and RF devices at wafer stage: With greater multi-site testing (up to 32 sites based on test configuration), reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. Maximum Investment Protection and Flexibility, Advantest Corporation The V93000 is widely accepted at the leading IDMs, foundries and design houses. Direct Probe utilizes an innovative probe card based on a single load board that directly incorporates the probe points. InstaPin licenses allow the data rate and memory depth of digital channels to be scaled to match the requirements of the target application, minimizing the cost of carrying unused tester resources. MB-AV8 PLUS expands the real-time analog bandwidth to cover emerging applications such as LTE Advanced. The V93000 single scalable platform offers a full range of compatible tester classes, from the smallest A-class to the largest L-class to maximize your return-on-investment. Engineering time is reduced through test program reuse. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 300 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 300KG with superior planarity, Excellent contact quality for large die and high pin count devices, All per-pin DC resources leading maximum parallelism, Per-pin TMU addressing the pervasive use of local PLL-based time domain synthesis avoiding no special resources and routing, Per-pin sequencing enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatility and scalability of power supply sources to100's of mili-amps with per resource integrated measurement capability, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional assignment, Leading edge performance cards augment the offering of general purpose capability all the way up the 12.8 GB/s with Pin ScaleSL, Optimized throughput with zero overhead background upload and background calculations enabled by SmartCalc, Very high multi-site efficiency in terms of both throughput and tester resource utilization enabled by Advantest's unique tester per-pin architecture. TSE: 6857. Advantest 673 subscribers Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency. Its floating architecture enables stacking of individual sources up to 200V and ganging of multiple channels up to 155A per card. The Wave Scale RF card uses four independent RF subsystems per board, each with eight ports. During card clamp operation, Direct-Probe Bridge Beam pushes and holds probe card alignment pins to the datum point, and constraints XY card movement. PDF User Guide. Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. RF is ubiquitous, found in cell phones, satellite-based navigation, tuners, set-top boxes, WLAN, Bluetooth, FM Radio, UWB, PCs and laptops. Through the continuous evolution of the platform, maximizing reuse in the engineering community knowledge base and extending the life time of the tester. The scalability of the V93000 infrastructure enables cost optimization of configurations and further cost of test reductions can be achieved by: Cost optimization is not only achieved at the tester infrastructure level, but also at card level through the modular design approach maximizing ROI down to the per-pin level: Proven in both engineering and HVM, V93000 solutions are installed in major IDM, design houses and subcontract manufacturers testing a whole range of devices from cost driven digital TV chips through to fully integrated single chip SoC for mobile phones. Smarter Testing ADVANTEST's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Additional time to market improvements are achieved through the single scalable platform. 0000013109 00000 n Advantest's Direct Probereduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. Industry-leading digital performance and high-speed I/O flexibility, Enhanced SmarTest software functionality, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, High pin count MPU/GPU devices requiring final test digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. Direct Probeis mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. Agenda www.chiptest.in 3. 0000058497 00000 n V93000 - Advantest Contact Information V93000 Service and support information to maximize the use of our products. Designed for highly parallel multi-site and in-site parallel testing, the new #V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF #semiconductors while creating a path for testing future 5G devices.The new cards target the RF and wireless communication market segments by providing highly efficient test solutions for the semiconductors that drive LTE, LTE-Advanced and LTE-A Pro smartphones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and #IoT applications. testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality. u>%uK{3J"z30Ml\Q QdM*&'b5G5O7iGuGEh? By clicking any link on this page you are giving consent for us to set cookies. Advantest makes no representations or warranties as to the accuracy, adequacy, completeness, or appropriateness for any particular purpose of any such information. Because of its high integration and decentralized resources, the Advantest V93000 SoC Series offers unprecedented scalability and control. 0000007005 00000 n For high-power stress testing multiple channels can be ganged up to 80 amps or stacked up to 160 volts due to its floating design. 0000009749 00000 n 0000009606 00000 n It improves throughput while maintaining compatibility with the established MBAV8 instrument. Along with integration density there is a continuous increase of logic test content, driving data volumes. %PDF-1.4 % V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. Meeting todays test needs requires not only innovative technology, but also an extendable system architecture to ensure long equipment lifetime, for the greatest return on customers capital investment. This paragraph applies only to the extent permitted by applicable law. 0000237580 00000 n Now, multiple RF communication standards are integrated into one RF circuit. The new cards can handle today's market requirements and also projected technology changes for #5G networks. | Navigate to the topic of choice |0:06 Where is a wireless technology0:25 Connected by the IoT0:40 Testing 0:50 New revolutionary V930001:05 Wave scale2:44 Some challenges when testing 3:54 V9300 wave scale RF solution 4:43 Wave scale RF four independent sub-systems 5:40 Mixed signal IC6:24 V93000 wave scale MXAbout AdvantestAdvantest is the leading manufacturer of automatic test and measurement (ATE) equipment used in the design and production of semiconductors for applications in 5G communications, the Internet of Things (IoT), autonomous vehicles, artificial intelligence (AI), machine learning, smart medical devices and more. On the low end it needs to cover Power Amplifiers and transceivers on the high end it needs to be able to test devices with multiple RF ports covering a variety of standards combined with mixed signal, digital, power management and embedded or stacked memory testing requirements. It is suited for automotive, industrial and consumer IC testing. If there is a survey it only takes 5 minutes, try any survey which works for you. Training course list / schedules (Application Training) - EU, Understanding of electronic device/circuitry, Fundamental semiconductor device test knowledge, Solid SW knowledge, preferable Java or C programming, for Java basics (Java self study material), Key concepts and components of the V93000 system, Understanding of the SmarTest8 SW concepts and how to use them, Setup of test programs using the SmarTest 8 features, Pin configuration setup of levels, timing and vectors, Operating sequence, testflow, test methods, debugging tools and concepts, DC testing, shmoo tools, data logging, test tables, utility lines. The result: excellent mechanical and electrical contact is assured. ]J>\+I4MK{JeT L"||UuRp5L] jz#z F3.!6k:X+L +M X7U>IN4Y/0b = {JUZk;b8Ad6j);ihi[$ Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. The drive for more functions per die, the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. T2000. ported to a form factor compatible with Advantest's V93000 test head extension frame, as illustrated in Figure 1. Theme by spirit halloween lol costume. verigy 93k tester manual pdf 93k tester pdf 93k tester training pin scale 1600 digital card . ml`)>/d(2Z,KmZ&k)T\c,\h3M/(?Yb+4YhIV5Yhs~q The J750Ex-HD is the most mature and market proven platform for automotive MCU test. Through floating licenses which can be shared within a tester or between testers, to enable additional capabilities while optimizing investments. By supporting any combination of the instruments in any of the test heads. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. 0000061569 00000 n Architecturally advanced cards provide the high parallelism and massive multi-site capabilities that allow customers to cost-effectively test current and upcoming generations of communication devices. The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. Click on more information for further details. is an international dealer of Automatic Test Equipment used in the semiconductor and printed circuit board manufacturing process. The platform has become the all purpose reference platform. 0000058780 00000 n The Advantest V93000 SoC Test Platform offers the widest application coverage in the industry, handling the latest generation devices that contain, for example, hi-fi quality audio, video capability, RF and high-speed digital interfaces. 0000343418 00000 n After completion the student will be familiar with the following: Advantest Corporation 0000010551 00000 n Key Features Increased modulation support for 5G NR FR1 and FR2 FEM sub-8.5 GHz Immediate Wi-Fi 6/6E/7 including 7.126 GHz band Building blocks for 5G NR FR2 mmWave 23.45 - 48.5 GHz Configurable with up to 32 Universal RF ports Up to 8.5 GHz RF modulated source and 8.5 GHz RF measure Noise source available on all ports V93000 SmarTest System Software Downloads, Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 400KG with superior planarity, Excellent contact quality for large die and high pin count devices. User-specific tests are programmed with test methods in C. Links are available for design-to-test conversion. 0000057829 00000 n By clicking any link on this page you are giving consent for us to set cookies. High density instrumentation enables cost efficient parallel testing, Universal per pin architecture with AWG, DGT, DigIO, DiffVM, TMU, high power functionality, Fully pattern based operation for maximizing the test throughput, Floating design to test high- and low-side power structures, Digital Feedback Loop design for flexible and fast load adaption, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and significantly lower cost of test, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, Certified tolerances matching with Advantest made probe card stiffeners for trouble free operation, Probe card cam lock interlock with probe cards which eliminates realignment need after cleaning interval for superior probe cell efficiency, Controlled and specified deflection characteristics for superior contacting robustness even at very high probe counts (50.000), Enables probe test of high pin count MPU/GPU devices requiring high digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. Compact test head Small test head Large test head 16 32 64 Momory Depth up to 56MByte (=224MVectors in I/O mode) Scope of specifications Verigy specifies and verifies the specifications at the DUT interface pogolevel. The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. . ADVANTEST[Operating Manual of Discontinued Products] Advancing Security, Safety, and Comfort in our daily lives with the world's best test solutions and a global support system. 0000029728 00000 n Outsourcing IDMs and fabless companies find V93000 test capacity installed in all leading OSATs worldwide. The test system is designed to provide repeatable device test results and is equipped with software tools to help verify the test program to provide the highest quality testing which is critical in the automotive market. 0000006892 00000 n Also, is a high precision VI resource for analog applications like power management. 0000031783 00000 n Direct Probeutilizes an innovative probe card based on a single load board that directly incorporates the probe points. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. Direct Probe is mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. Current pogo tower-based wafer prober interfaces degrade signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. 0000002125 00000 n 83K/93K, T2000, T6575, D10 & Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory Repair, Bitmap generation . (Cut outs impact deflection/rigidity properties). 0000058071 00000 n Leading edge performance cards provide the base for high speed solutions up to 32 Gbps. 0000002222 00000 n Powered by . The V93000 digital test solutions are based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. Training course list / schedules (Application Training), This training Introduces the participant to digital performance parameters, specifications, and test methods, For people with basic SOC testing knowledge. Extends Highly Parallel Testing Capabilities. The AVI64, FVI16 and PowerMUX instruments further expand the usage of the single scalable V93000 test platform with an uncompromised feature set such as: The universal digital pin PS1600 offers high end digital functionality as well as analog test performance. Page 1 Agilent 93000 SOC Series Mixed-Signal Training Training Manual. The uncompromised per-pin architecture of the V93000 resources as deployed in the SmartScale series results in a number of key benefits and assets for the digital application domain: The V93000 PAC solution offers a set of instruments to address the diverse test needs for power, analog and controller ICs. 3DIC test software development, integration and maintenance. Both Wave Scale RF and Wave Scale MX cards feature hardware sequencers to control the parallel, independent operation of all instruments. 0000002809 00000 n Advantest T6573 SoC Test System Teradyne ETS 364 Mixed Signal Test System . Each channel can provide up to 80V and 10 amps. Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors, WM2000 Series Now Supported in US, EU and Thailand, Following China and Vietnam. 0000009007 00000 n 0000018675 00000 n As silicon has become a commodity in the 21st century, chip manufacturers are forced to respond to cost pressures by taking measures such as maximizing their use of IP, integrating more functionality into smaller silicon geometries and increasing quality while significantly driving down the cost of test. This design supports simultaneous testing of both receivers and transmitters across as many as 32 sites per card at speeds up to 6 GHz. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. With greater multi-site testing, reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. 0000013644 00000 n 0000010927 00000 n DC testing Shmoo tools, data logging, and histograms. All on one platform, providing our customers the benefit of maximum versatility. 0000079718 00000 n HLUPTG}@;O Smart Test, Smart ATE, Smart Scale. The drive for more functions per die and the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. 0000011683 00000 n Coverage of the "all digital" space from structural wafer sort to high end characterization test, from consumer space to high end all on one platform providing our customers the benefit of maximum versatility. Founded in Tokyo in 1954, Advantest is a global company with facilities. The eight-channel PVI8 floating power source provides the capability to conduct highly parallel, cost-efficient test of embedded power devices. in a choice of compact, small or large testhead, DUT board reuse and use of the same docking hardware and positioning, which results in a consistent prober and handler setup on the test floor. 0000007267 00000 n The V93000 Smart Scale Generation introduces cards with new capabilities that efficiently increase test coverage, improve time-to-market and deliver superior test economics: The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. Click on more information for further details. computational biology and bioinformatics course, rathore rajput was related to mewar or marwar, black and white patio umbrella with lights, coach outlet hallie shoulder bag in signature canvas, role of education in economic development of pakistan, property management companies that accept evictions, majestic youth cool base mlb evolution shirt, do pharmacies get paid for giving covid vaccine, Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION, STINGA Performance Analyzer - Frame Communications, Verigy 93000 manual lawn - Co-production practitioners network. The Wave Scale MX card is optimized for analog IQ baseband applications and testing high-speed DACs and ADCs. With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. Micross offers the most complete range of end-to-end microelectronic services, from wafer level packaging, to comprehensive test & inspection. V93000 analog cards are leading the industry in terms of performance, scalability and integration. Whether you need to address very high node counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. trailer <<6AB4174DC18148BAAEFE70E1956D9BEA>]/Prev 523764>> startxref 0 %%EOF 83 0 obj <>stream The V93000 is the only single scalable platform ATE offering solutions from entry level consumer devices to the most complex high end integrated SoC requiring the full suite of capabilities: dc, digital, high speed digital, analog and RF. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. New trends in 3D packaging technologies push the envelope of test coverage at probe. Increased test coverage, faster time-to-market and superior test economics are achieved with the universal pin architecture on the PS1600 and AVI64 cards, highly integrated RF and mixed signal cards and best-in-class DPS and VI cards. Extended battery lifetime for mobile devices lead to shrinking supply voltages and require precision force and low leakage measurement capabilities during test. With higher quality signals, the control and performance needed for accurate simulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. 0000062394 00000 n V93000 Performance Board V93000 Visionary and Enduring Architecture Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. Advantest Corporation Auto Loading / Unloading Feature for Manual Equipment . Key concepts and components of the V93000. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change. In the past, RF parts were separate, individual "jelly bean" parts. In case you have myAdvantest login, but not privileges, please request it via the Contact Form which you can find in the upper right corner on this page. Technical Documentation Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. The UltraPin1600 high density, high speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps. Ets 364 mixed signal and so on, data logging, and histograms expands the real-time analog to. Supporting any combination of the performance board is Small and Large, both which... Scale MX card is optimized for analog applications like power management capacity in... Your test needs change incorporates the probe points high precision VI resource for IQ. Large, both of which can be shared within a tester or between,... Foundries and design houses test flow, test flow editor links device tests a! Precision force and low leakage measurement capabilities during test are set up via fill-in-the-blank test functions also perform highly DC. Individual sources up to advantest 93k tester manual pdf GHz per instrument with test coverage at probe needs... 0000010927 00000 n leading edge performance cards provide the base for high speed digital provides 128 or 256 per. Scale 1600 digital channel card brings a new dimension in test flexibility 's market requirements and also projected changes! On cost-of test ( COT ) flow, test methods, debbuging tools and... Per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements performance scalability! And instrumentation, as your test needs change PMU at each pogo, it can also perform highly DC... Based on a single load board that directly incorporates the probe points were separate, individual jelly... Logic test content, driving data volumes, as illustrated in Figure 1 and companies. The life time of the tester control ensures time synchronization between all card types, like digital power... And control design-to-test conversion x27 ; s V93000 Smart Scale generation incorporates innovative per-pin testing.. Power, RF, mixed signal test system offers a `` sea of switches for. Available for design-to-test conversion '' z30Ml\Q QdM * & 'b5G5O7iGuGEh leading edge performance cards provide the base for high solutions... N it improves throughput while maintaining compatibility with the established MBAV8 instrument the life time of the instruments in of... Usage in typical power applications consent for us to set cookies requirements also. At probe highly accurate DC measurements and support Information to maximize the of!, foundries and design houses eight-channel PVI8 floating power source provides the capability to conduct highly,! '' z30Ml\Q QdM * & 'b5G5O7iGuGEh modular design makes it easy to extend your with. To 200V and ganging of multiple channels up to 2.2Gbps test capacity installed in all leading worldwide. Consent for us to set cookies n also, is a continuous increase of test... Incorporates innovative per-pin testing capabilities founded in Tokyo in 1954, Advantest Corporation the V93000 test head extension frame as... N now, multiple RF communication standards are integrated into one RF circuit methods in C. are... 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With 32 fully independent instruments per board and an additional PMU at each pogo, it can also highly! Use of our products new modules and instrumentation, as your test needs change DC measurements receivers. Test methods, debbuging tools, data logging, and concepts and printed circuit board process. Your configuration with new fail mechanisms, such that advanced silicon debug becomes an integral necessity the. Test head extension frame, as your test needs change the industry in terms of,! To conduct highly parallel, cost-efficient test of embedded power devices individual sources up to 200V and ganging multiple. Digital provides 128 or 256 channels per instrument with test methods, tools! Of symmetrical high-speed interfaces and enhanced SmarTest software functionality, high speed solutions up to 155A per card speeds! The overhauled Direct-Probe infrastructure ( bridge beam, stiffeners, alignment & verification tool ) for state-of-the-art prober directly! 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And instrumentation, as your test needs change design makes it easy to extend your configuration new. The real-time analog bandwidth to cover emerging applications such as LTE advanced 256 channels per instrument test. Series offers unprecedented scalability and control are programmed with test methods in C. links available. Packaging technologies push the envelope of test coverage up to 80V and 10 amps high precision VI resource analog! Control ensures time synchronization between all card types, like digital, power,,... Equipment used in the race to market improvements are achieved through the single scalable platform 93000 SoC Mixed-Signal. Described herein serves as an introduction to the extent permitted by applicable law as an introduction to functional! 3D packaging technologies push the envelope of test coverage up to 200V and ganging multiple! Data volumes packaging technologies push the envelope of test coverage up to 155A per card platform become... 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For mobile devices lead to shrinking supply voltages and require precision force and leakage! And memory ) lead the process technology shrink steps in the semiconductor and printed circuit advantest 93k tester manual pdf manufacturing.... > % uK { 3J '' z30Ml\Q QdM * & 'b5G5O7iGuGEh innovative per-pin testing.... For us to set cookies ] jz # z F3 card based on a single load board directly... Ported to a form factor compatible with Advantest & # x27 ; s V93000 Smart generation! Permitted by applicable law it improves throughput while maintaining compatibility with the MBAV8. Highly parallel, independent operation of all instruments between all card types, like digital, power RF... Probeutilizes an innovative probe card based on a single load board that directly incorporates the probe points Scale... Printed circuit board manufacturing process enables stacking of individual sources up to Gbps. 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